

Short Description:
High-temperature confocal scanning laser microscopy enables high-resolution imaging both at room temperature and at very high temperatures. It combines the advantages of a mirror furnace with those of confocal optics including a laser. For high-temperature investigations, the device features two distinct modules, each enabling a specific examination spectrum. These consist of an ultra-high-temperature module (SVF17SP), which allows temperatures of up to 1,800 °C and high heating and cooling rates (up to 100 K/s). The second module (SVF15FTC), on the other hand, enables the application of tensile or compressive forces during investigations at temperatures of up to 1,400 °C.
Technical Specifications:
| Magnifications | 20/50/100 |
| Heating and cooling rate | up to 100K/s |
| Software modules | HiTTS, HiTOS |

Short Description:
The Gleeble is a multifunctional system that can be used for both materials testing and characterization as well as the physical simulation of manufacturing processes. Its essential components — a servohydraulic system and a heating unit for conductive heating of specimens — allow for virtually any combination of mechanical and thermal loading up to the melting range. Investigations under isothermal conditions, such as tensile and compression tests at elevated temperatures, as well as those with heating rates of up to 10,000 K/s are both possible. The Gleeble is therefore particularly well suited for the targeted analysis of the effects of various process strategies in additive manufacturing on the material condition. This can either be characterized mechanically directly in the Gleeble or subsequently examined using other methods — e.g. metallographically.
Technical Specifications:
| Max. test force in tension / compression | 100 kN / 200 kN |
| Max. crosshead displacement | 125 mm |
| Crosshead speed | 0,001 … 2000 mm/s |
| Max. Temperatur | ca. 1800 °C |
| Max. heating rate | 10000 K/s |
| Max. cooling rate | abhängig von Probenmaterial/-geometrie und Kühlmedium |
Applications:
- Physical simulation of manufacturing processes (e.g. additive manufacturing, welding, heat treatment, …)
- Conducting tensile and compression tests at elevated temperatures
- Characterization of phase transformations, generation of time-temperature-transformation (TTT) diagrams
- Characterization of hot cracking susceptibility
Equipment:
- Grips for round specimens of various diameters as well as for specimens with square cross-sections (Charpy impact specimens)
- Load cells for the ranges ±200 kN and ±20 kN
- Various thermocouples and a ratio pyrometer for temperature measurement
- Various high-temperature extensometers for measuring longitudinal and transverse strain
- Specimen chamber for investigations in air, vacuum, and inert atmosphere (argon, helium)
Contact Person:
Zijin Dai
zijin.dai@tum.de

Short Description:
The Kappa SS-CF 100 is an electromechanical creep testing machine by ZwickRoell, developed for demanding tests under alternating loads. With a maximum test force of 100 kN, it is suitable for force- and strain-controlled creep fatigue tests. Thanks to its backlash-free central spindle drive, it offers maximum flexibility and precision for a wide range of applications.
Capabilities and Tests That Can Be Performed:
- Tensile tests at elevated temperatures (up to 1,100 °C)
- Tensile tests at room temperature (limited capacity)
- Testing of creep and relaxation behavior at elevated temperatures (up to 1,100 °C)
- Low-cycle fatigue testing (LCF) at elevated temperatures (up to 1,000 °C)
- Creep-fatigue testing at elevated temperatures (up to 1,000 °C)
- Tensile tests on small specimens at elevated temperatures (up to 1,100 °C)
Technical Specifications:
| Maximum test force (F_max) | 100 kN |
| Test space height | 1.290 mm |
| Test space width | 695 mm |
| Crosshead travel | 200 mm |
| Machine height | 2.260 mm |
| Crosshead speed | 1 µm/h to 250 mm/min |

Short Description:
The DM6 M is a fully motorized and fully coded reflected light microscope. It is used for the optical examination, analysis, and documentation of metallographic sections. At magnifications from 25 to 1,000×, microstructures are displayed and evaluated using brightfield, darkfield, differential interference contrast, and polarization contrast. The analytical methods are supported by the Leica Application Suite X (LAS X) software.
Technical Specifications:
| Magnification | 25/100/200/500/1,000× + 1/1.5/2× optical post-magnification |
| Illumination modes | Brightfield, darkfield, differential interference contrast, polarization contrast |
| Camera | DMC4500 (5 MP CCD microscopy camera incl. 64-bit driver software, selectable resolution in interlace mode) |
| Software modules | LAS X Quantimet Standard Software Package, LAS X Stitching, LAS X 3D Surface Package, LAS X Industry Core |

Short Description:
The M205 C is a motorized and fully coded optical stereo microscope. It is used for the macroscopic examination, analysis, and documentation of complete components or large-area metallographic sections. The apochromatically corrected optics offer magnifications from 7.8 to 160× with a maximum motorized focus travel of 620 mm. The analytical methods are supported by the Leica Application Suite X (LAS X) software.
Technical Specifications:
| Magnifications | 7,8/10/12,5/16/20/25/32/40/50/63/80/100/125/160-x |
| Illumination modes | Ring light, gooseneck LED spotlights, brightfield, darkfield, polarization contrast |
| Camera | DMC5400 (20 MP CMOS microscopy camera incl. 64-bit driver software, selectable resolution in interlace mode) |
| Software modules | LAS X Measurements, LAS X Stitching, LAS X 3D Surface Package, LAS X Industry Core |


Short Description:
The BRILLANT 250 is an automatic wet cutting machine for specimens up to a maximum of Ø 135 mm. It cuts specimens of a wide variety of geometries, sizes, and materials gently and with minimal contact force. For the cutting process, a choice can be made between continuous and pulsed feed, the latter offering improved cooling of the components being cut.
Technical Specifications:
| Max. specimen size | Ø 135 mm |
| Cutting wheel size | up to Ø 356 mm |
| X-axis (traversing cut) automatic | 260 mm |
| Y-axis (plunge cut) automatic | 180 mm |
| Rotational speed | variabel 800-3400 U/min |

Short Description:
The QPRESS 50 is a compact and powerful hot mounting press for the embedding of metallographic specimens. Through precise control of temperature, pressure, and holding time, it enables uniform, reproducible mounting with excellent edge retention. Its robust construction and user-friendly operation make it ideal for use in laboratories with high demands on quality and efficiency.
Technical Specifications:
| Mounting cylinder diameter | 25-40 mm |
| Closure system | Sliding lock |
| Temperature range | 20 – 200 °C |
| Cooling time | Adjustable |
| Heating time | Adjustable |
| Maximum pressure in mounting cylinder | 250–350 bar (depending on mould size) |

Short Description:
The SAPHIR 550 with RUBIN 520 is a single-spindle grinding and polishing device with an innovative grinding and polishing head. The equipment features a motor-driven variable height adjustment, pneumatic clamping with individual and central pressure, a memory function, an integratable dosing system, and material removal measurement. The device is used for manual or semi-automatic grinding and polishing of metallic and non-metallic specimens. In semi-automatic mode, up to six specimens can be prepared simultaneously.
Technical Specifications:
| Working disc | Ø 300 mm |
| Variable disc speed | 50 - 600 rpm |
| Variable specimen holder speed at polishing head | 30 - 150 rpm |
| Number of specimens (individual/central pressure) | 1–6 specimens Ø 50 mm depending on specimen holder |
| Specimen contact force (individual pressure) | Variable, 5–100 N |
| contact | Variable, 20–400 N |
Short Description:
The Saphir Vibro vibratory polishing device was developed for deformation-free final polishing of materialographic specimens. This preparation method is particularly well suited for investigations such as EBSD analysis (electron backscatter diffraction), nanoindentation using AFM (atomic force microscopy), or microhardness testing. Due to the especially gentle material removal, the process is suitable for very soft and ductile materials such as titanium-aluminum, copper or copper alloys, Ni-based materials, aluminum and aluminum alloys, soft steels, etc.
The large Ø 308 mm polishing bowl offers ample space for very large specimens, complete specimen holders, or for the simultaneous polishing of up to 21 specimens. Polishing cloths suitable for the magnetic system with a diameter of 300 mm or 305 mm (12") can be used.
Technical Specifications:
| Polishing bowl | Ø 308 mm |
| Vibration frequency | 60 - 120 Hz |

Short Description:
The KRISTALL 680 is a precise electrolytic polishing and etching system for metallographic specimen preparation. It enables reproducible, artifact-free surfaces through controlled electrochemical processes. The adjustable parameters ensure optimal adaptation to various materials and microstructures, making it ideally suited for high-resolution microscopic investigations.
Technical Specifications:
| Connected load | 2 kVA |
| Maximum voltage | 90 V DC |
| Maximum current | 14 A |
| Polishing duration | 1 second – 25 minutes |
| Etching duration | 1 second – 5 minutes |
| Dimensions (W × H × D) | 330 x 220 x 400 mm |
| Weight | approx. 7 kg |

Short Description:
The QNESS 60A+ EVO is a high-precision hardness testing device offering a wide range of hardness testing methods including Vickers, Brinell, Rockwell, and Knoop. It enables precise measurement of hardness values for metals and alloys across various hardness levels. The device offers high repeatability and is suitable for both research and industrial applications.
Technical Specifications:
| Testing methods | Vickers, Rockwell, or Knoop |
| Test force range | 1 N bis 62,5 kgf |
| Hardness scale range | HV 0.01 to HV 60 (Vickers) |
| Specimen height | Max. 250 mm |
| Dimensions (L × W × H) | 400 x 400 x 600 mm |
| Software | Q-Soft software for data analysis |